{"product_id":"an-introduction-to-mixedsignal-ic-test-and-measurement-the-aoxford-series-in-electrical-and-computer-engineering-9780195140163","title":"An Introduction to Mixed-Signal IC Test and Measurement (The ^AOxford Series in Electrical and Computer Engineering)","description":"\u003cdiv class=\"book-description\"\u003e\n\u003cp\u003e\u003cstrong\u003eAn Introduction to Mixed-Signal IC Test and Measurement (The ^AOxford Series in Electrical and Computer Engineering)\u003c\/strong\u003e by Roberts, Gordon W.. hardcover edition. ISBN: 9780195140163.\u003c\/p\u003e\n\u003cp\u003eIntegrated circuits incorporating both digital and analog functions have become increasingly prevalent in the semiconductor industry. Mixed-signal IC test and measurement has grown into a highly specialized field of electrical engineering. However, test engineering is still a relatively unknown profession compared to IC design engineering. It has become harder to hire and train new engineers to become skilled mixed-signal test engineers. The slow learning curve for mixed-signal test engineers is largely due to the shortage of written materials and university-level courses on the subject of mixed-signal testing. While many textbooks have been devoted to the subject of digital test and testability, the same cannot be said for analog and mixed-signal automated test and measurement.\nAn Introduction to Mixed-Signal IC Test and Measurement is a textbook for advanced undergraduate and graduate-level students as well as engineering professionals. It was written in response to the shortage of basic course material for mixed-signal test and measurement. The book assumes a solid background in analog and digital circuits as well as a working knowledge of computers and computer programming. A background in digital signal processing and statistical analysis is also helpful, though not absolutely necessary.\nThis text encompasses the testing of both analog and mixed-signal circuits including many borderline examples. Digital testing is covered, but not as extensively because of the wealth of information on this topic already available. Examples and illustrations using state-of-the-art industrial technology enrich and enliven the presentation throughout. In considering the applications of this technology, the testing of large-scale mixed-signal circuits and individual circuits is introduced. The value-added benefits of mixed-signal IC testing to a manufacturers product are clearly discussed, and the role of the test engineer is clearly defined.\u003c\/p\u003e\n\u003c\/div\u003e","brand":"Oxford University Press, USA","offers":[{"title":"Default Title","offer_id":44966258737205,"sku":"ByrdShop_0195140168","price":111.77,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0627\/8139\/0901\/files\/9780195140163_82ebf5c0-bd71-4b94-a26a-dc1ad99d3b90.jpg?v=1778655774","url":"https:\/\/atxbooks.com\/products\/an-introduction-to-mixedsignal-ic-test-and-measurement-the-aoxford-series-in-electrical-and-computer-engineering-9780195140163","provider":"ATX Books","version":"1.0","type":"link"}