{"product_id":"built-in-test-for-vlsi-pseudorandom-techniques-9780471624639","title":"Built In Test for VLSI: Pseudorandom Techniques","description":"\u003cp\u003eThis handbook provides ready access to all of the major concepts  techniques  problems  and solutions in the emerging field of pseudorandom pattern testing. Until now  the literature in this area has been widely scattered  and published work  written by professionals in several disciplines  has treated notation and mathematics in ways that vary from source to source. This book opens with a clear description of the shortcomings of conventional testing as applied to complex digital circuits  revewing by comparison the principles of design for testability of more advanced digital technology. Offers in-depth discussions of test sequence generation and response data compression  including pseudorandom sequence generators; the mathematics of shift-register sequences and their potential for built-in testing. Also details random and memory testing and the problems of assessing the efficiency of such tests  and the limitations and practical concerns of built-in testing.\u003c\/p\u003e","brand":"My Store","offers":[{"title":"Default Title","offer_id":45279746916405,"sku":"ByrdShop_0471624632","price":201.91,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0627\/8139\/0901\/files\/9780471624639.jpg?v=1780608817","url":"https:\/\/atxbooks.com\/products\/built-in-test-for-vlsi-pseudorandom-techniques-9780471624639","provider":"ATX Books","version":"1.0","type":"link"}