{"product_id":"scanning-electron-microscopy-and-xray-microanalysis-third-edition-9780306472923","title":"Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition","description":"\u003cdiv class=\"book-description\"\u003e\n\u003cp\u003e\u003cstrong\u003eScanning Electron Microscopy and X-Ray Microanalysis: Third Edition\u003c\/strong\u003e by Goldstein, Joseph. hardcover edition. ISBN: 9780306472923.\u003c\/p\u003e\n\u003cp\u003eIn the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis, there has been a great expansion in the capabilities of the basic scanning electron microscope (SEM) and the x-ray spectrometers. The emergence of the variab- pressure\/environmental SEM has enabled the observation of samples c- taining water or other liquids or vapor and has allowed for an entirely new class of dynamic experiments, that of direct observation of che- cal reactions in situ. Critical advances in electron detector technology and computer-aided analysis have enabled structural (crystallographic) analysis of specimens at the micrometer scale through electron backscatter diffr- tion (EBSD). Low-voltage operation below 5 kV has improved x-ray spatial resolution by more than an order of magnitude and provided an effective route to minimizing sample charging. High-resolution imaging has cont- ued to develop with a more thorough understanding of how secondary el- trons are generated. The ?eld emission gun SEM, with its high brightness, advanced electron optics, which minimizes lens aberrations to yield an - fective nanometer-scale beam, and “through-the-lens” detector to enhance the measurement of primary-beam-excited secondary electrons, has made high-resolution imaging the rule rather than the exception. Methods of x-ray analysis have evolved allowing for better measurement of specimens with complex morphology: multiple thin layers of different compositions, and rough specimens and particles. Digital mapping has transformed classic x-ray area scanning, a purely qualitative technique, into fully quantitative compositional mapping.\u003c\/p\u003e\n\u003c\/div\u003e","brand":"Springer","offers":[{"title":"Default Title","offer_id":44955505426485,"sku":"ByrdShop_0306472929","price":118.92,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0627\/8139\/0901\/files\/9780306472923_c8b085c8-f578-4315-beac-c3fea792cc34.jpg?v=1781402081","url":"https:\/\/atxbooks.com\/products\/scanning-electron-microscopy-and-xray-microanalysis-third-edition-9780306472923","provider":"ATX Books","version":"1.0","type":"link"}