{"product_id":"semiconductor-material-and-device-characterization-ieee-press-9780471739067","title":"Semiconductor Material and Device Characterization (IEEE Press)","description":"\u003cp\u003e\u003c\/p\u003e","brand":"My Store","offers":[{"title":"Default Title","offer_id":45279848562741,"sku":"ByrdShop_0471739065","price":167.31,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0627\/8139\/0901\/files\/9780471739067.jpg?v=1780613576","url":"https:\/\/atxbooks.com\/products\/semiconductor-material-and-device-characterization-ieee-press-9780471739067","provider":"ATX Books","version":"1.0","type":"link"}