{"product_id":"testing-of-digital-systems-9780521773560","title":"Testing of Digital Systems","description":"\u003cp\u003eDevice testing represents the single largest manufacturing expense in the semiconductor industry  costing over $40 billion a year. The most comprehensive and wide-ranging book of its kind  Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics  the authors take the reader through every key area  including detailed treatment of the latest techniques such as system-on-a-chip and IDDQ testing. Written for students and engineers  it is both an excellent senior\/graduate level textbook and a valuable reference.\u003c\/p\u003e","brand":"My Store","offers":[{"title":"Default Title","offer_id":67902270963765,"sku":"ByrdShop_0521773563","price":122.06,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0627\/8139\/0901\/files\/9780521773560.jpg?v=1793821440","url":"https:\/\/atxbooks.com\/products\/testing-of-digital-systems-9780521773560","provider":"ATX Books","version":"1.0","type":"link"}