Built In Test for VLSI: Pseudorandom Techniques

Name: Built In Test for VLSI: Pseudorandom Techniques
Brand: Wiley
SKU: ByrdShop_0471624632
Price: 155.31 USD
Availability: InStock

hardcover – January 1, 1987

by Bardell, Paul H.

$155.31 USD

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ISBN-13: 9780471624639 ISBN-10: 0471624632

Publisher

Wiley

Binding

hardcover

Published

January 1, 1987

Weight

1.5 lbs

Dimensions

23.90×2.30×16.40 cm

About this book

Built In Test for VLSI: Pseudorandom Techniques by Bardell, Paul H.. hardcover edition. ISBN: 9780471624639.