Design-For-Test for Digital Ic's & Embedded Core Systems

Design-For-Test for Digital Ic's & Embedded Core Systems by Crouch, Alfred L.. paperback edition. ISBN: 0076092030379.

The purpose of this book is to introduce the basic concepts of test and design-for-test (DFT), and to then address the application of these concepts with an eye toward the trade-offs of the engineering budgets (area, frequency, power, etc.), the business drivers, and the cost drivers. This practical guide on the test and Design-for-test topics has been developed along the lines of a just what you need to know and how to do it guide that explains the topic, the trade-offs, and relates the topic to the design flow.